On May 14 at 2:30 p.m., a guest lecture “Metrology in nanoscience” was held by the stakeholder of the educational scientific program 105 Applied Physics and Nanomaterials (third scientific and educational level) of the full member of the Academy of Metrology of Ukraine, Prof. Dr. Vashpanov Yurii Oleksandrovych (Odesa State Academy of Civil Engineering and Architecture). The language of the lecture was English. The lecture was attended by second-year graduate students (Yurii Bondaruk, Sivak Ihor and Tuzhykov Andrii) and third-year graduate students (Popryaga Diana) of Ushynsky University, as well as a second-year graduate student of the Institute of Applied Physics of the NAS of Ukraine (Dryhaylo Valentyna). The lecture was also attended by Prof. Ushynsky University, Dr. Gokhman Oleksandr Rafailovych, Dr. Kiv Aryk Yukhymovych, Donchev Ivan Ivanovych, Associate Professor, Candidate of Physical and Mathematical Sciences, Donchev Ivan Ivanovych, Candidate of Physical and Mathematical Sciences, Assistant and Peleshchak Roman Mykhailovych, Professor at Lviv Polytechnic, Doctor of Physical and Mathematical Sciences. The content of the lecture "Metrology in nanoscience" was relevant to the disciplines "Physical foundations of sensor electronics" and "Inverse problems of X-ray and neutron diffraction", which are taught in the second semester to second-year graduate students, and can also be useful when conducting research into the properties of nanostructures. At the end of the lecture, Professor Vashpanov answered numerous questions from the audience.